EWDTS07 - Call for Papers

Submission Deadline July 25th, 2007!

CALL FOR PAPERS

Scope -- Location -- Deadlines -- Information -- Committee Members

Scope

The main target of the IEEE East-West Design & Test Symposium (EWDTS) is to exchange experiences between the scientists and technologies of the Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic systems. The workshop aims at attracting scientists especially from countries around the Black Sea, the Baltic states and Central Asia.
We cordially invite you to participate and submit your contribution(s) to EWDTS’07 which covers (but is not limited to) the following topics:

Analog, Mixed-Signal and RF Design & Test
ATPG and High-Level TPG
Built-In Self-Test
Debug and Diagnosis
Defect/Fault Tolerance and Reliability
Design for Testability
Design Verification and Validation
Electronic Design Automation Tools
Embedded Software
Failure Analysis, Defect and Fault Modeling
FPGA Design & Test
High-level Synthesis
High-Performance Networks on a chip
Low-power Design
Memory and Processor Test
Modeling & Fault Simulation
Modeling and Synthesis of Embedded Systems
Object-Oriented System Specification and Design
On-Line Test
Power Issues in Testing
Real Time Embedded Systems
Reliability of Digital Systems
Self-Repair and Reconfigurable Architectures
System Level Modeling, Simulation & Test Generation

CAD Session:

CAD and EDA Tools, Methods and Algorithms
Design and Process Engineering
Logic, Schematic and System Synthesis
Place and Route
Thermal, Timing and Electrostatic Analysis
Wireless Systems Synthesis

Location

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The Symposium will take place in Armenia, where Noah’s Arc landed. The capital city, Yerevan, is one of the oldest inhabited cities in the world and is surrounded by ancient monuments and beautiful nature. Besides being famous for its cognac and nice sunny autumn, Yerevan is a city of science, culture and high tech R&D.

Deadlines

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Submission deadline: July 25th, 2007
Notification of acceptance: August 3rd, 2007
Camera ready: August 9th, 2007

Information

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Prof. Vladimir Hahanov
Design Automation Department
Kharkov National University of Radio Electronics
Lenin ave, 14
Kharkov, 61166, Ukraine.
Tel.: +380-57-702-13-26
E-mail: hahanov@kture.kharkov.ua
www.ewdtest.com/conf/

Committee Members

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General Chairs
V. Hahanov – Ukraine
Y. Zorian – USA

General Vice-Chairs
M. Karavay – Russia
R. Ubar – Estonia

Program Chairs
S. Shoukourian – Armenia
D. Speranskiy – Russia

Program Vice-Chairs
M. Renovell - France
Z. Navabi - Iran
V. Saposhnikov– Russia

Publicity Chairs
C. Landrault - France
S. Mosin – Russia

Local Arrangement Chair
T. Atoyan – Virage Logic

Program Committee
E. J. Aas – Norway
J.   Abraham – USA
R. Bazylevych – Ukraine
A. Drozd – Ukraine
E. Evdokimov – Ukraine
A. Chaterjee – USA
E. Gramatova – Slovakia
S. Hellebrand – Germany
S. Hyduke – USA
A. Ivanov – Canada
V. Kharchenko – Ukraine
K. Kuchukjan – Armenia
V. Kureichik– Russia
A. Marchenko – Russia
A. Matrosova – Russia
V. Melikyan - Armenia
O. Novak – Czech Republic
A. Orailoglu – USA
Z. Peng – Sweden
A. Petrenko – Ukraine
P. Prinetto – Italy
J.   Raik – Estonia
A. Romankevich – Ukraine
A. Ryjov – Russia
R. Seinauskas – Lithuania
S. Sharshunov – Russia
A. Singh – USA
J.   Skobtsov – Ukraine
A. Stempkovsky – Russia
V. Tverdokhlebov – Russia
V. Vardanian - Armenia
V. Yarmolik – Byelorussia
A. Yessayan – Armenia

Steering Committee
M. Bondarenko – Ukraine
V. Hahanov – Ukraine
R. Ubar – Estonia
Y. Zorian – USA

Organizing Committee
S. Shoukourian – Armenia
S. Chumachenko – Ukraine
K. Mostova – Ukraine
M. Kaminska – Ukraine
V. Obrizan – Ukraine

For more information, visit us on the web at: http://www.ewdtest.com/conf/

The workshop is organized by Kharkov National University of Radio Electronics and Armenia’s Semiconductor Organizations, in cooperation with Tallinn University of Technology, Moscow Institute of Control Sciences, Kiev Institute of Modeling Problems in Power Engineering, RAS Institute of Design Problems in Microelectronics.It is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) and financially supported by Microsoft, Intel, Cadence, Echostar, INTSPEI and Aldec Inc.